Used Metrology / Inspection (Semiconductors) in Meath, Ireland

PUMPS - Cybor, Balor, Kurt J Lesker, Thomas, Levitronix, Gast Group, Ingersoll-Rand

• used

• Manufacturer: Gast

Nnew to Stock. These Pumps are available in ireland OEM VPN Part Description Qty OH Comments CYBOR 00511-05 PUMP_RESIST_CYBOR 2 CYBOR 00511-05 PUMP_RESIST_CYBOR 1 Baldor CD100VSS-494-015-200-36-3T7 "Pump, Neslab"...

Convac Developer

• used

• Manufacturer: Convac

GCA/TROPEL 9000 Surface Flatness Analyzer

• used

• Manufacturer: GCA/TROPEL

GCA/TROPEL 9000 Surface Flatness Analyzer Serial Number 202579 Fringe Sensitivity Range: 0.5 to 10.0 ? per Fringe System Accuracy: 0.25? Maximum Test Area: 5.0” x 4.5” Maximum Resolution: 0.10? Tilt Adjustable Wo...

ADE Episcan 1000 FT-IR

• used

• Manufacturer: ADE
• Model: EPISCAN 1000

Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Wafer Mapping Scanning Stage casse...

KLA 2608 Wafer Review Station 8 Inch

• used

• Manufacturer: KLA-Tencor

Still in Fab

Hitachi S-7840

• refurbished

• Manufacturer: Hitachi
• Model: S-7840

Process Type: Metrology & Inspection Date of Manufacture: 2001 Refurbished Hitachi S-7840 configured for 6 or 8 inch (smaller wafer sizes possible) SW Version: 11 Options list: SECS Multipoint Measurement ...

August NSX-90

• used

• Manufacturer: August

Configuration: August NSX-90 is a macro defect inspection tool solution used through out the device manufacturing process. Macro defects (defects 5 micron and larger) can take place during wafer manufacturing, pr...

FEI XL40 Cross-section SEM

• used

• Manufacturer: FEI

FEI XL40 CROSS SECTION SEM WORKING CONDITION refurbished AVAILABLE IN WAREHOUSE

KLA-TENCOR ULTRAPOINTE 1010

• used

• Manufacturer: KLA-Tencor
• Model: CRS1010

KLA-TENCOR ULTRAPOINTE MODEL 1010 WAFER LASER CONFOCAL IMAGING SYSTEM Used, Sold as-is Looks complete October 1995 Vintage KLA-TENCOR ULTRAPOINTE MODEL 1010 WAFER LASER CONFOCAL IMAGING SYSTEM Used, Sold as-is Lo...

RUDOLPH WV320 300mm

• used

• Manufacturer: Rudolph
• Model: WV320

RUDOLPH WV320 Wafer size: 300mm Process: measurement

MEL M54L/100-10B24NK optical distance sensor

• used

• Manufacturer: MEL

Part taken from a working tool

Applied Materials Excite IPM 832

• used

• Manufacturer: Amat

High speed wafer Inspection System for bare wafers

Veeco Wyko NT8000 Optical Profiling System

• used

• Manufacturer: Veeco Wyko
• Model: NT8000

Hard Drive and software not included

KLA EV300

• used

• Manufacturer: KLA-Tencor
• Model: EV300

Leica MIS 200

• used

• Manufacturer: Leica
• Model: MIS 200

Missing some parts Sold as-is Wafer size: 200mm