Used Metrology / Inspection (Semiconductors) in Meath, Ireland

Ohkura DP2301

• used

• Manufacturer: Ohkura

profiler

P&M PNM-7600 WAFER THICKNESS MEASUREMEN

• used

• Manufacturer: P&M

KLA-TENCOR KLA2131 200mm

• used

• Manufacturer: KLA-Tencor
• Model: KLA2131

KLA-TENCOR KLA2131 Wafer size: 200mm Process: measurement

Topcon Technologies Mi-5080

• used

• Manufacturer: Topcon
• Model: MI-5080

TEL Certas

• used

• Manufacturer: Tokyo Electron - TEL
• Model: CERTAS

KLA-Tencor P2

• used

• Manufacturer: KLA-Tencor
• Model: P2

P2H Long Scan Profiler

RUDOLPH FE-IV D Film Thickness Measurement Tool

• used

• Manufacturer: Rudolph

150MM

Canon model number: FPA-2000 i1

• used

• Manufacturer: Canon
• Model: FPA2000

model number: FPA-2000 i1 wafer: 6"

Canon Stepper model number NSR-2005i10D

• used

• Manufacturer: Canon

model number: NSR-2005i10D wafer 6"

Canon Stepper model number: FPA-1550 Mark4

• used

• Manufacturer: Canon
• Model: FPA1550

model number: FPA-1550 Mark4 wafer 6"

Applied Materials Verasem 3D

• used

• Manufacturer: Amat
• Model: VeraSEM

APPLIED MATERIALS (AMAT) VERASEM 3D AUTOMATED CD METROLOGY SYSTEM Wafer Specification o Wafer Size: 200MM o Wafer Shape: SNNF (Semi Notch No Flat) o Wafer : 6”, 8” or 12” Electron Optical System o Electron Gun Sc...

Bede BedeMetrix Diffractometer Goniometer 300mm Sample Stage Assembly

• used

• Manufacturer: Bede

Sold as-is Parts or refurbishment Please inquire for details

SIGMA 205 WAFER THICKNESS MEASUREMEN

• used

• Manufacturer: Sigma

TEL Mark-8 Coater/Developer

• used

• Manufacturer: Tokyo Electron - TEL

3xCoat, 2xDevelop, R to L, Dual Block

Reichert-Jung Ultracut E 70 17 04

• used

• Manufacturer: Reichert Jung