Used Metrology / Inspection (Semiconductors) in China

NCS Special Customized Flaw Detection Equipment

• Manufacturer: Steel Nano

Instrument name: Special Customized Flaw Detection Equipment | Instrument model: Parts testing equipment | Automotive, railroad, and materials industries such as: Bearing inner and outer ring automatic flaw dete...

NCS Railway system series flaw detection equipment

• Manufacturer: Steel Nano

Instrument IntroductionApplicable to detect wheel rim defects, in line with the TB/T3182-2007 standard and "wheel pair fault dynamic detection system technical conditions" and other relevant national standards re...

NCS NCS-PAUT automatic ultrasonic phased array flaw detection equipment for bars

• Manufacturer: Steel Nano

Instrument description suitable for metallurgy and steel, machinery, electric power, aerospace, oil and gas, boilers and other industries bar surface and internal defects detection. Instrument features 1. phased ...

NCS Automatic ultrasonic flaw detection equipment for bar ends

• Manufacturer: Steel Nano

Instrument introduction mainly for metallurgy and steel, machinery, electric power, aerospace, oil and gas, boilers and other industries end of the bar blind detection. Instrument features 1. end detection range ...

PHOTAL MCPD-2000

• Manufacturer: PHOTAL

Equipment status: Equipment name: Box thickness gauge

1999 TSK 5000A

• Manufacturer: Accretech - Tokyo Seimitsu - TSK
• Model: 5000A

SONOSCAN D9000

• Manufacturer: Sonoscan

Equipment name: Microscope

V-CUT thickness meter

• Manufacturer: Minder Hightech

V-CUT residual thickness gauge Economical, convenient and durable Easy to operate and use High accuracy Convenient adjustment Good stability 1. The machine should be placed on a level ground to ensure its stabili...

Hitachi S-3400N Scanning Electron Microscope

• Model: S-3400N

Hitachi Model S-3400N Scanning Electron Microscope with TMP molecular pump vacuum system saves floor space and power supply power consumption. It is mainly used for the effective analysis of the microscopic morph...

Hitachi High-Tech Field Emission Scanning Electron Microscope SU8220

• Model: SU8220

The existing models SU8240, SU8230, SU8220 and SU8010 have been re-integrated to form the Regulus8240, Regulus8230, Regulus8220, and Regulus8100. The Regulus series inherits the observation and analysis performan...

NCS Electronic extensometer

• Manufacturer: Steel Nano

Instrument name: Electronic extensometer | Electronic extensometer is a core device used to accurately measure the linear deformation between two points of a material sample. its operation is based on the combin...

NCS Multi-functional Mechanical Properties Micro-magnetic Non-destructive Testing Instrument

• Manufacturer: NCS

NCS RA series fully automatic testing system

• Manufacturer: Steel Nano

Instrument name: RA series fully automatic testing system | Instrument model: RA Series | 1. stable test rate: Ensure the reliability and comparability of test results. | 2. intelligent image recognition system:...

NCS CS3500 Carbon and Sulfur Analyzer

• Manufacturer: NCS

-channel configuration: Standard three independent infrared absorption channels, according to customer demand can increase the high sulfur channel, can be configured with four independent infrared absorption cha...

NCS CS3500G Carbon and Sulfur Analyzer

• Manufacturer: NCS