Used Metrology / Inspection (Semiconductors) in California, USA

Frontier 413MOT

• Manufacturer: frontier semiconductor

Thickness and total thickness variation (TTV) mapping system. TTV and Thickness of wafer substrate, thick layers, wafers on tape, bonded wafers, etc. Manual loading, auto-mapping. Warp, Roughness, and Thin Film T...

Frontier 500TC

Evaluate the thermal properties and stability (film stress) of thin films up to 500 degree C in inert gas. 200mm or 300mm chamber. Manually loading.

Frontier 4pp

• Manufacturer: Frontier Semiconductor

4-Point Probe Technique for measuring the sheet resistance of epi, metal films, substrates. Table top and fully automated cassette to cassette systems available.

Frontier 128 C2C

• Manufacturer: Frontier Semiconductor

Dedicated Film Stress mapping system with high resolution for high throughput process control for wafers up to 200mm diameter. Fully automated cassette to cassette, SECS/GEM Film Stress and Bow Measurement tool. ...

Frontier 413 C2C

• Manufacturer: Frontier Semiconductor

Thickness and total thickness variation (TTV) mapping system. TTV and Thickness of wafer substrate, thick layers, wafers on tape, bonded wafers, etc. Fully automated cassette to cassette system, SECS/GEM complian...

Frontier 900TC-VAC

• Manufacturer: frontier semiconductor

Multi-Probe Vacuum Integrated Metrology System is a unique integrated metrology system to measure film stress and wafer bow height during thermal annealing and cooling cycles. It features a vacuum heating chamber...

Frontier 413 SA

• Manufacturer: Frontier Semiconductor

Thickness and total thickness variation (TTV) mapping system. TTV and Thickness of wafer substrate, thick layers, wafers on tape, bonded wafers, etc. Semi-automatic system with enclosure. Manual loading, automati...

Frontier 128 FPD

• Manufacturer: frontier semiconductor

Full Panel local and global film stress measurements on glass using reflected pattern and photo-elastic measurement technology. Panel size G4.5 and G6.

Four Dimensions 280

• Manufacturer: Four Dimensions
• Model: 280

Automatic Four Point Probe Meter 120V, 60Hz. Serial no. 971014. Includes PC & monitor. 20in x 18in x 14in

Hitachi SU-70

• Manufacturer: Hitachi
• Model: SU70

Up for sale is a high-performance Hitachi SU-70 Scanning Electron Microscope (SEM), renowned for its exceptional imaging capabilities and advanced features. This SEM is ideal for a wide range of applications, inc...