Used Metrology / Inspection (Semiconductors) in China

NCS NCS-GMT Series Steel Pipe Magnetic Particle Flaw Detection Equipment

• Manufacturer: NCS

Instrument name: Steel pipe magnetic particle automatic flaw detection equipment | Instrument model: NCS-GMT | (level of) sensitivity: A1-30/100 standard test piece groove

NCS NCS Series Capacitive Coupling / Wireless Transmission Ultrasonic Rotary Head

• Manufacturer: NCS

Instrument introduction is suitable for metallurgy, machinery, electric power, aerospace, petroleum and other industries of various types of pipe (seamless pipe, welded pipe, plain carbon steel pipe, stainless st...

NCS NCS Series Capacitive Coupling / Wireless Transmission Ultrasonic Rotary Head

• Manufacturer: NCS

Instrument introduction is suitable for metallurgy, machinery, electric power, aerospace, petroleum and other industries of various types of bar ultrasonic testing. Instrument features a flaw detection to complet...

HGTECH Wafer Thickness Measuring Series Semiconductor Wafer Thickness Measuring Equipment

• Manufacturer: Hgtech

Product advantages: Used for 4-8 inch original wafer, substrate and epitaxial wafer of various materials and polishing conditions Thickness range: 0-1mm measurement accuracy: ± 1 μ M repetition accuracy: 0.2 μ m ...

1999 TSK 5000A

• Manufacturer: Accretech - Tokyo Seimitsu - TSK
• Model: 5000A

SONOSCAN D9000

• Manufacturer: Sonoscan

Equipment name: Microscope

PHOTAL MCPD-2000

• Manufacturer: PHOTAL

Equipment status: Equipment name: Box thickness gauge

V-CUT thickness meter

• Manufacturer: Minder Hightech

V-CUT residual thickness gauge Economical, convenient and durable Easy to operate and use High accuracy Convenient adjustment Good stability 1. The machine should be placed on a level ground to ensure its stabili...

Hitachi S-3400N Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-3400N

Hitachi Model S-3400N Scanning Electron Microscope with TMP molecular pump vacuum system saves floor space and power supply power consumption. It is mainly used for the effective analysis of the microscopic morph...

Hitachi High-Tech Field Emission Scanning Electron Microscope SU8220

• Manufacturer: Hitachi
• Model: SU8220

The existing models SU8240, SU8230, SU8220 and SU8010 have been re-integrated to form the Regulus8240, Regulus8230, Regulus8220, and Regulus8100. The Regulus series inherits the observation and analysis performan...

NCS RA series fully automatic testing system

• Manufacturer: NCS

Instrument name: RA series fully automatic testing system | Instrument model: RA Series | 1. stable test rate: Ensure the reliability and comparability of test results. | 2. intelligent image recognition system:...

NCS Electronic extensometer

• Manufacturer: NCS

Instrument name: Electronic extensometer | Electronic extensometer is a core device used to accurately measure the linear deformation between two points of a material sample. its operation is based on the combin...

NCS Multi-functional Mechanical Properties Micro-magnetic Non-destructive Testing Instrument

• Manufacturer: NCS

NCS CS3500 Carbon and Sulfur Analyzer

• Manufacturer: NCS

-channel configuration: Standard three independent infrared absorption channels, according to customer demand can increase the high sulfur channel, can be configured with four independent infrared absorption cha...

NCS CS3500G Carbon and Sulfur Analyzer

• Manufacturer: NCS