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Used Metrology / Inspection (Semiconductors) in Gyeonggi-do, South Korea

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    CENSOR ANS 100

    • Manufacturer: CENSOR

    Advanced Nanodefect Surfce Inspection System

    Yongin-si, South Korea
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    KLA Tencor KT2401

    • Manufacturer: KLA-Tencor

    ILM2401 Automated Macro Defect Inspection System

    Yongin-si, South Korea
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    2000 Hitachi S-9220S

    • Manufacturer: Hitachi
    • Model: S-9220

    CD SEM Wafer size: 200mm

    Yongin-si, South Korea
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    AMAT OPAL 7830i

    • Manufacturer: Amat

    CD SEM, Automated

    Yongin-si, South Korea
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    AMAT SEM Vision

    • Manufacturer: Amat
    • Model: Semvision

    AUTO DEFECT REVIEW SEM/EDX,CU Wafer size: 200mm

    Yongin-si, South Korea
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    Hitachi Hitech S9300

    • Manufacturer: Hitachi
    • Model: S-9300

    193 nm CD SEM Wafer size: 200mm

    Yongin-si, South Korea
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    KLA Tencor 5240

    • Manufacturer: KLA-Tencor

    PARC OPTIPROBE Wafer size: 200mm

    Yongin-si, South Korea
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    KLA Tencor 6220

    • Manufacturer: KLA-Tencor
    • Model: 6220

    Surfscan

    Yongin-si, South Korea
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    Nanometrics 4000

    • Manufacturer: Nanometrics
    • Model: 4000

    Film Thickness Measurement

    Yongin-si, South Korea
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    Nicolet ECO-1000

    • Manufacturer: Nicolet
    • Model: ECO-1000

    FTIR

    Yongin-si, South Korea
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    1997 Hitachi S-7800

    • Manufacturer: Hitachi
    • Model: S-7800

    CD SEM Wafer size: 125mm

    Yongin-si, South Korea
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    1998 Nicolet ECO-RS

    • Manufacturer: Nicolet

    FTIR Wafer size: 300mm

    Yongin-si, South Korea
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    Hitachi S-4800

    • Manufacturer: Hitachi
    • Model: S-4800

    type II, 5 axis motorized stg, Dig Imaging

    Yongin-si, South Korea
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    KLA Tencor 8250/8300/8450

    • Manufacturer: KLA-Tencor

    Win NT controller, 30nm feature size, 4.0nm res, 4"-8", 55wfs/hr

    Yongin-si, South Korea
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    Hitachi S-4500

    • Manufacturer: Hitachi
    • Model: S-4500

    type II, 5 axis motorized stg, Dig Imaging, EDS, SE, MCP BSE

    Yongin-si, South Korea
34567