SDI/SEMILAB FAaST 230
- Manufacturer: Semilab
- Model: FAAST 230
. Up to 8" . Automatic robotic wafer handling . Single open-cassette wafer loading station . Measurement of dielectric and interface properties on monitor wafer - Dielectric Capacitance (CD) and Thickness (EOT) -...
Cheonan-si, South Korea
2018 SDI/SEMILAB WT-2020
- Manufacturer: Semilab
■ System Configuration . WT2020 main unit with scanning capability . μ-PCR head for lifetime measurements . Vacuum pump . Utility : ■ Hadware Function Capability . μ-PCD measurement (904 nm Laser) . Laser Power F...
Cheonan-si, South Korea
2009 SDI/SEMILAB WT-2000PV
- Manufacturer: Semilab
- Model: WT-2000PV
■ System Configuration . WT2000PV main unit with scanning capability . Sample stage (Max wafer size 200mm) . μ-PCD head for lifetime measurements . Vacuum pump . Utility : ■ Hadware Function Capability . μ-PCD me...
Cheonan-si, South Korea
2006 KLA TENCOR OSA6100
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
2010 KLA TENCOR Candela CS20
- Manufacturer: KLA-Tencor
- Model: CANDELA CS20
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
N&K OptiPrime - CD
- Manufacturer: N&K
Key Qualities of OptiPrime - CD ■ Optimized Polarized Reflectance (Rs and Rp) Data - Micro-Spot Technology ■ Can be Configured for 300 mm (12”), 200 mm (8”),and 150 mm (6”) Wafers ■ Fully Automated ■ Based on Pat...
Cheonan-si, South Korea
Microsense Microsense 6033T
- Manufacturer: Microsense
Wafer Thickness gauge for up to 150mm wafers Wafer size: 6" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
SOLID STATE MEASRUEMENT INC. SSM2000
- Manufacturer: SOLID STATE MEASRUEMENT INC.
System Measurement Performance Computer Subsystem Automated Features •;; Probe conditioning /•;; Probe calibration /•;; Sample alignment /•;; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing S...
Cheonan-si, South Korea
2006 N&K N&K 5000-CD
- Manufacturer: N&K
To be fully refurbished. Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2012 KLA TENCOR P16+
- Manufacturer: KLA-Tencor
- Model: P16
The KLA-Tencor P-16+ Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces. •; Up to 8" wafer size •; Microhead 5 - sr •; Dual view optic (Top & sid...
Cheonan-si, South Korea
1997 Schmitt Measurement System TMS 2000
- Manufacturer: Schmitt Measurement System
AS-IS Wafer size: 6" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
1998 PROMETRIX RS35
- Manufacturer: PROMETRIX
*. Measurement perfomance: - 4 Point Probe check surface on Silicon wafer - Measurement range 5 Megohm/sq - Routine check 1-30 sites programmable - Counter/ 3-D map, Diameter scan 49,81,121,225,361,441,625 site...
Cheonan-si, South Korea
1994 BIO-RAD QS-300
- Manufacturer: Bio-Rad
- Model: QS-300
■ Capable 4" to 8" Wafer ■ Optical Console - Michelson Interferometer - KBr Beam split / - DTGS Detector & Element - He-Ne Laser & IR Source ■ Wafer Tray / Nose cone - Wafer Size : up to 8" / - Ruler increm...
Cheonan-si, South Korea
1999 VEECO VEECO Detak V200-SL
- Manufacturer: Veeco - Sloan
As-Is Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2002 KLA TENCOR P-15
- Manufacturer: KLA-Tencor
- Model: P-15
- Long Scan Profiler P-15 Measurement. - Micro Head II SR - Pentium III 733MHz, Ram 256MB & 19" LCD Color Monitor, Windows NT 4.0 - Installed in Clean-room. - Can demonstrate any time.
Cheonan-si, South Korea
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