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Jeol Scanning Electron Microscope (PC-SEM) JSM-6490 Bruker XFlash Detector
- Manufacturer: Jeol
Jeol Type: Jeol JSM-6490 Jeol scanning electron microscope Jeol JSM-6490 scanning electron microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope with newly developed electron optics an...
$40,598 USDBorken, Germany - Trusted Seller
2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
- Manufacturer: Jeol
- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measurements - Acceleration Voltage: 100 and 200 kV - Filament...
United States - Trusted Seller
2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
- Manufacturer: Jeol
Jeol 2100 Probe-Corrected Analytical Electron Microscope - Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measur...
United States - Trusted Seller
2018 Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope
- Manufacturer: Jeol
- Model: JSM
Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope IXRF EDS detector included DOM: 2018 High resolution imaging in HV/LV/SE/BSE Zeromag-mode for intuitive transition from light-optic to SEM image Che...
United States - Trusted Seller
JEOL JSM 7600 F SEM
- Manufacturer: Jeol
- Model: JSM
Resolution: - 1nm guaranteed at 15kV SEM mode - 2.5nm at 1kV in SEM mode - 1.5nm at 1kV in GB mode Magnification: - SEM: x100 (at WD 25mm) to x1,000,000 (at WD 8mm) - Low-Mag LM mode: x25 to x19,000 Imagin...
United States Refurbished FEI Nova NanoSEM 600 Scanning Electron Microscope Nano SEM
- Manufacturer: FEI
- Model: NOVA NANOSEM 600
“Large chamber field emission electron microscope. Currently installed and running, available for demonstration. Installation and training available.” This listing is for one Refurbished FEI Nova NanoSEM 600 Scan...
Sparks, NV- Trusted Seller
2011 JEOL JSM 7001F Schottky Emission SEM
- Manufacturer: Jeol
- Model: JSM
Resolution: 1.2 nm at 30 kV, 3.0 nm at 1.0 kV Accelerating Voltage: 0.5 to 30 kV Specimen Stage: Mechanically eucentric at all WDs Imaging modes: SE, BEI to E/T detector OS: Windows 10 External Detectors: None
United Kingdom 
JEOL JWS-7555
- Manufacturer: Jeol
For sale is a high-performance JEOL JWS-7555 Scanning Electron Microscope (SEM), known for its advanced imaging capabilities and precision. This SEM is ideal for a wide range of applications, including semiconduc...
$55,000 USDHayward, CA
Modular Confocal Raman Microscope
Optosky new generation ATR8700 split confocal Raman microscopy imager equipped with a precision adjustable confocal pinhole, high resolution spectrometers, HD digital camera, and -70℃ deep cooling detector and ot...
Xiamen, China
Confocal Raman Microscope for Graphene Analysis
Optosky ATR8800C Series Confocal Raman Imaging Microscope: Advanced Tool for Comprehensive Graphene Analysis The Optosky ATR8800C Series Confocal Raman Imaging Microscope is a state-of-the-art, high-resolution Ra...
Xiamen, China
Routine Raman Microscope
ATR3110XW Raman spectrometer microscope adaptation version is a breakthrough high-sensitivity Raman spectrometer developed by Optosky. It uses a cooled high-sensitivity CCD, which makes the instrument have good e...
Xiamen, China
Super-Fast Raman Imaging Microscope
The ATR8810 Ultra-Fast Line-Scan Raman Spectral Imaging System is a groundbreaking macro Raman spectral imaging instrument developed by Optosky after more than 20 years of Raman spectrometer research experience a...
Xiamen, China
Compact Confocal Raman Microscope
The ATR8600 compact confocal Raman microscopy has built-in pinhole confocal, high-resolution spectrometer, and HD digital imaging technology. It combines the advantages of the microscope and Raman spectrometer. T...
Xiamen, China- Trusted Seller
Hitachi S 3000 N
- Manufacturer: Hitachi
- Model: S-3000N
SEM - Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management ...
United States
