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Jeol JSM-IT100 Scanning Electron Microscope.
- Manufacturer: Jeol
- Model: JSM
Jeol JSM-IT100 Scanning Electron Microscope.
Sugar Land, TXVisit Auction Website 
Leo 1450vpse scanning electron microscope Damaged
- Manufacturer: LEO/ZEISS
This Leo 1450vpse scanning electron microscope was damaged during transportation please see pics to determine the extent of damage or arrange an inspection,It is being offered here AS IS FOR PARTS.The year of...
- Trusted Seller

Hitachi S-800 Scanning Electron Microscope
- Manufacturer: Hitachi
Hitachi S-800 Scanning Electron Microscope, Anelva 956-7152, Daia DPF-4Z Parts
United States - Trusted Seller

JEOL JWS-7555 scanning electron microscope
- Manufacturer: Jeol
JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical equipment, providing a high level of image performance. It is suitable for a wide range of applications, including ...
United States 
QTY. 1. CAMBRIDGE INSTRUMENTS STEREO SCAN 260 SCANNING ELECTRON MICROSCOPE
QTY. 1. CAMBRIDGE INSTRUMENTS STEREO SCAN 260 SCANNING ELECTRON MICROSCOPE S/N: 260-02-02 SPEC: S. 260 AND OPERATORS MANUAL WITH OXFORD EDS. DET. AREA 10MM^2 ATT.1 32E58882A WINDOW ATW2 ATT.2 0120113 RESOL. 133 E...
Texas City, TX- Trusted Seller

2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
- Manufacturer: Jeol
- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measurements - Acceleration Voltage: 100 and 200 kV - Filament...
United States - Trusted Seller

2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
- Manufacturer: Jeol
Jeol 2100 Probe-Corrected Analytical Electron Microscope - Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measur...
United States - Trusted Seller

HITACHI TM-3030Plus Desktop Scanning Electron Microscope
- Manufacturer: Hitachi
- Model: TM3030 PLUS
The Hitachi TM-3030Plus Desktop Scanning Electron Microscope is a unit type microscope manufactured in Japan. It is designed for high-resolution imaging and analysis in various fields such as research, education,...
United States Jeol JWS-7505 Wafer Inspection System Tilt SEM Scanning Electron Microscope
- Manufacturer: Jeol
Home Contact About Technology Industrial Lab & Test Electrical Semiconductor Jeol JWS-7505 Wafer Inspection System Tilt SEM Scanning Electron Microscope Manufacturer: Jeol Model: JWS-7505 Condition: For Parts or ...
- Trusted Seller

JEOL JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope Lab
- Manufacturer: Jeol
This JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope was removed from a university lab where it was surplus to requirements. It is in good cosmetic condition with minor marks from use. The l...
United States - Trusted Seller

JEOL Jeol JSM-5910LV SEM Scanning Electron Microscope Lab
- Manufacturer: Jeol
- Model: JSM
This Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it was surplus to requirements. The system has not been tested. The Oxford dewar has come away from the unit and dent...
United States - Trusted Seller
Hitachi 560-5530 Relay PCB COL-CN2 S-9300 Scanning Electron Microscope Working
- Manufacturer: Hitachi
“Removed from a Hitachi S-9300 CD Scanning Electron Microscope System” Hitachi 560-5530 Relay PCB COL-CN2 S-9300 Scanning Electron Microscope Working Inventory # A-9963, K-183 Model No: COL-CN2 Removed from a Hit...
$603 USDAlbuquerque, NM - Trusted Seller

JEOL JSM-6700F Field Emission Scanning Electron Microscope Edax Detector
- Manufacturer: Jeol
- Model: JSM
This Jeol JSM-6700F Field Emission Scanning Electron Microscope Edax Detector is in good cosmetic condition with signs of use. There are a number of side panels that have been removed and set aside, I'm not sure...
United States - Trusted Seller

JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Working Surplus
- Manufacturer: Jeol
- Model: JSM
- Model No: JSM-6300F Column - Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System This JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly is used working surplus. The unit has som...
United States - Trusted Seller
GW Electronics Type 43 Infrared Chamberscope JEOL JSM-6300/6400F Working Surplus
- Manufacturer: Jeol
- Model: JSM-6400
GW Electronics Type 43 Infrared Chamberscope JEOL JSM-6300/6400F Working Surplus Inventory # 21122 For use with the JEOL JSM-6300/6400F SEM Scanning Electron Microscope System This GW Electronics Type 43 Infrared...
$1,006 USDAlbuquerque, NM
