Building Filters

SBT Semi-Automatic Ultrasonic Scanning Microscope
- Manufacturer: SBT
Scope of Application Synchronized scanning of dual probes, instant imaging, improve the efficiency of production line scanning Replaceable transmittance module for synchronized C/T scanning. Equipment Advantages ...
Shanghai, China
SBT Fully Automated Wafer Ultrasonic Scanning Microscope
- Manufacturer: SBT
Scope of Application Suitable for 6, 8, 12-inch wafer bonding inspection Equipment Advantages Loadport can be interfaced with standard Cassette etc. Wafer-specific Robot for sampling, barcode reading, and sample ...
Shanghai, China
SBT Semi-Automatic Wafer Ultrasonic Scanning Microscope
- Manufacturer: SBT
Scope of Application 6, 8, 12-inch wafer bonding inspection Equipment Advantages No metal contamination in the system, configured with a miniature environment (FFU) package design Meets Class2 (Class 100) cleanli...
Shanghai, China- Trusted Seller

Nanbei afm microscope
- Manufacturer: Nanbei
Feature of Multimode Atomic Force AFM Microscope ◆ The laser detection head and the sample scanning table are integrated, stable and reliable; ◆ Precision laser and probe positioning device, easy to replace the...
Zhengzhou, China - Trusted Seller

Nanbei Multimode Atomic Force Microscope
- Manufacturer: Nanbei
Feature of Multimode Atomic Force Microscope: ◆ The laser detection head and the sample scanning table are integrated, stable and reliable; ◆ Precision laser and probe positioning device, easy to replace the pr...
Zhengzhou, China 
SBT In-Line Ultrasonic Scanning Microscope US301-A
- Manufacturer: SBT
Scope of Application Josun Ultrasonics has launched an in-line ultrasonic scanning microscope, which utilizes automatic loading and unloading, automatic scanning, and automatic identification, analysis, and scree...
Shanghai, China
Ultrasonic scanning microscope Laes830
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes610
1. Introduction: 1. As China's semiconductor materials industry begins to promote the "Nanniwan Spirit" of domestic manufacturing and self-reliance, it is developing in the direction of refinement, high-end, cutt...
Shanghai, China
Ultrasonic scanning microscope Laes330
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes320
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes1300
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes820
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes530
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes520
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes410
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
