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Used Test & Measurement (Semiconductors) in South Korea

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    1995 KLA-TENCOR SFS6420

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6420

    INSPECTION UNIT Wafer size: 8"

    Yongin-si, South Korea
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    1997 KLA-TENCOR AIT

    • used

    • Manufacturer: KLA-Tencor
    • Model: AIT

    Particle Review Wafer size: 8"

    Yongin-si, South Korea
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    2006 VEECO DIMENSION X3D

    • used

    • Manufacturer: Veeco - Sloan
    • Model: Dimension

    AUTOMIC FORCE MICROSCOPE

    Yongin-si, South Korea
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    HMI eScan310

    • used

    • Manufacturer: HMI
    • Model: Escan 310

    Defect Inspection Wafer size: 300mm

    Yongin-si, South Korea
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    AMAT Complus 3T

    • used

    • Manufacturer: Amat
    • Model: Complus

    Defect Inspection (Dark Field) Wafer size: 300mm

    Yongin-si, South Korea
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    KLA-Tencor AIT XUV

    • used

    • Manufacturer: KLA-Tencor
    • Model: AIT XUV

    Defect Inspection (Dark Field) Wafer size: 300mm

    Yongin-si, South Korea
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    2007 RUDOLPH MP300

    • used

    • Manufacturer: Rudolph
    • Model: MP 300

    Wafer size: 12

    Yongin-si, South Korea
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    TKK MAC-110MV1

    • used

    • Manufacturer: TKK

    TKK Overlay Wafer size: 8"

    Yongin-si, South Korea
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    2009 RUDOLPH MP300

    • used

    • Manufacturer: Rudolph
    • Model: MP 300

    Wafer size: 300

    Yongin-si, South Korea
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    2004 AMAT ComPlus MP

    • used

    • Manufacturer: Amat
    • Model: Complus

    Wafer size: 8

    Yongin-si, South Korea
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    KLA SFS-7700 313270

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 7700

    Defect insp Wafer size: 8"

    Yongin-si, South Korea
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    SEIKO Sxi200P K-A113000022

    • used

    • Manufacturer: SEIKO

    Inspection SEM Wafer size: 8"

    Yongin-si, South Korea
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    SEIKO Sxi200P K-A113000022

    • used

    • Manufacturer: SEIKO

    Inspection SEM Wafer size: 8"

    Yongin-si, South Korea
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    Nanometrics NanoSpec 210

    • used

    • Manufacturer: Nanometrics
    • Model: Nanospec

    Wafer size: 5

    Yongin-si, South Korea
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    Nikon OPTIPHOT 66

    • used

    • Manufacturer: Nikon
    • Model: Optiphot 66

    Wafer size: 6

    Yongin-si, South Korea
  • Agilent - Keysight 4155C Test & Measurement (semiconductors)

    Agilent - Keysight 4155C Test & Measurement (semiconductors)

    • used

    • Manufacturer: Agilent - Keysight
    • Model: 4155C

    Good condition Agilent - Keysight 4155C Test & Measurement (semiconductors)s manufactured in 2005. Located in USA and other countries. Click request price for more information.

    USA
910111213