JEOL ARCNET ITF PB in Albuquerque, NM, USA
Used
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Specifications
- Condition
- used
- Stock number
- CONF-1266
- Mpn
- AP002778-00
- System/tool
- JEOL JWS-2000 Wafer Defect Review SEM
- Part no
- AP002778-00
- Subcategory
- Circuit boards & prototyping
- Subcategory 2
- Printed circuit boards (pcbs)
- Subcategory 3
- Electrical equipment & supplies
- Subcategory 4
- Electronic components & semiconductors
- Subcategory 5
- Semiconductor tools systems and components
- Listing ID
- 99415416
Description
“Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System”
JEOL AP002778-00 ARCNET ITF PB PCB Card JWS-2000 Wafer Detect SEM Working Spare
Inventory # CONF-1266
Model No: ARCNET ITF PB
Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System
This JEOL AP002778-00 ARCNET ITF PB PCB Card is used working surplus. The physical condition is good, but there are signs of previous use and handling.
Sale Details
Item Condition:
Used Working, 90 Day Warranty
Estimated Packed Shipping Dimensions:
L x W x H = 14"x14"x14" @ 8 lbs.
Only items pictured are included:
If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
For items with multiple quantities:
The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
Items are sold with a
90-Day Satisfaction Guarantee
Seller Reviews
$609 USD