BRAND STAGE ITF PB in Albuquerque, NM, USA
Used
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Specifications
- Condition
- used
- Stock number
- CONF-1267
- Mpn
- BP101541-01
- System/tool
- JEOL JWS-2000 Wafer Defect Review SEM
- Part no
- BP101541-01
- Subcategory
- Circuit boards & prototyping
- Subcategory 2
- Printed circuit boards (pcbs)
- Subcategory 3
- Electrical equipment & supplies
- Subcategory 4
- Electronic components & semiconductors
- Subcategory 5
- Semiconductor tools systems and components
- Listing ID
- 99400180
Description
“Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System”
JEOL BP101541-01 STAGE ITF PB PCB Card JWS-2000 Wafer Detect SEM Working Spare
Inventory # CONF-1267
Model No: STAGE ITF PB
Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System
Installed EPROM's
Part No: STG MASTER, Ver 10.03, VWS024102, IC3F(ODD)
Part No: STG MASTER, Ver 10.03, VWS024102, IC3D(EVEN)
This JEOL BP101541-01 STAGE ITF PB PCB Card is used working surplus. The physical condition is good, but there are signs of previous use and handling.
Sale Details
Item Condition:
Used Working, 90 Day Warranty
Estimated Packed Shipping Dimensions:
L x W x H = 14"x14"x14" @ 8 lbs.
Only items pictured are included:
If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
For items with multiple quantities:
The pictured item is not necessarily the one that will be sent.
Seller Reviews
$759 USD