2018 Keyence VK-X1050 in Reno, NV, USA
Used
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Specifications
- Condition
- used
- Year
- 2018
- Serial number
- 9D810020
- Stock number
- 00001
- Total magnification
- Up to 28,800x
- Field of view (minimum range)
- 11 um to 7,398 um
- Frame rate (laser measurement speed)
- 4 to 125 Hz, 7,900 Hz
- Optical system
- Pinhole confocal optical system, Focus variation
- Light-receiving element
- 16-bit photomultiplier: High-definition color CMOS
- Scanning method
- Automatic upper/lower limit setting, high-speed light intensity optimization (AAGII), poor reflected light intensity supplement (Double Scan)
- Height measurement display resolution
- 5 nm
- Height measurement repeatability (sigma): laser confocal
- 20x: 40nm 50x: 20nm
- Height measurement repeatability (sigma): focus variation
- 5x: 500nm 10x: 100nm 20x: 50nm 50x: 30nm
- Height measurement accuracy
- 0.2 + L/100 um or less (L = measuring length)
- Width measurement display resolution
- 10 nm
- Width measurement repeatability 3(sigma): laser confocal
- 20x: 100nm 50x: 50nm
- Width measurement repeatability 3(sigma): focus variation
- 5x: 400nm 10x: 400nm 20x: 120nm 50x: 65nm
- Width measurement accuracy
- Measured value +/-2% or less
- Xy stage operating range
- 100 mm x 100mm (3.94" x 3.94")
- Measuring head
- VK-X1050 Red semiconductor laser (picture 3-4)
- Base
- VK-D1 (picture 4-5)
- Motorized xy stage
- VK-S2100 (picture 4, 6)
- Controller
- VK-X1000 (picture 7-9)
- Computer
- Dell Precision Tower 3420 (picture 10-12)
- Software license
- VK-H2J USB Dongle (picture 13)
- Step height standard
- VLSI SHS-1.QC-G2 (picture 14-15)
- Xy calibrated scale
- Keyence OP-87657 (picture 16-17)
- Alignment kit
- Manufacturer provided charts and flats (picture 18)
- Image stitching module dvd
- VK-H2J (picture 19)
- Dust cover
- 1 Manufacturer provided dust cover (picture 2)
- Analysis software dvd
- VK-X1000 series (picture 20)
- Category
- Microscopes in USA
- Subcategory
- 3d laser scanning confocal microscope
- Listing ID
- 96573862
Description
Measures in X, Y, and Z direction at nanometer-level resolution for very accurate profile and surface roughness measurements at multiple levels of magnification. Easy to set up and use at room temperature and pressure with no pre-processing of samples needed.
Less than 150 hours of use. Full working condition.
User's manual and software manuals included (PDF and physical copy).
Manufacturer's factory calibration performed November 2018. In-house calibration maintenance procedure performed yearly using Operation Check procedure from manufacturer provided Manual with calibrated step height standard and XY calibration slide (included). Cleaned and recalibrated in-house in 2024 using factory calibration for reference. In-house maintenance performed yearly for step height standard and XY calibration slide. All calibration data and certificate available on request.