Agilent 4155A in Cary, NC, USA

Semiconductor Parameter Analyzer The 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range. I: 1 fA to 100 mA (20 fA offset accuracy) V: 1 micro V to 100 V fully automated I-V sweep measurements with dc or pulse mode expandable up to 6 SMUs synchornized stress/measure fuction two high-voltage pulse generator units (+/- 40 V) With the 4155A, you can improve your semiconductor quality, from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis.