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Used KLA-Tencor CS20 Metrology / Inspection (Semiconductors)

  • 2006 KLA TENCOR CS20

    2006 KLA TENCOR CS20

    • Manufacturer: KLA-Tencor
    • Model: CS20

    [ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...

    Cheonan-si, South Korea
  • 2006 KLA TENCOR CS20

    2006 KLA TENCOR CS20

    • Manufacturer: KLA-Tencor
    • Model: CS20

    [ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...

    Cheonan-si, South Korea