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  • Trusted Seller
    KLA-Tencor AIT II Patterned Surface

    KLA-Tencor AIT II Patterned Surface Defect Inspection System

    • Manufacturer: KLA-Tencor
    • Model: AIT II

    KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...

    Decatur, GA
  • Trusted Seller
    KLA-Tencor AIT I Patterned Surface

    KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...

    Decatur, GA
  • Trusted Seller
    KLA-Tencor AIT I Patterned Surface

    KLA-Tencor AIT I Patterned Surface Defect Inspection System

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...

    Decatur, GA
  • Trusted Seller
    1997 KLA AIT I Main

    1997 KLA AIT I Main System

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...

    United States
  • KLA-Tencor Model AIT XP Darkfield

    KLA-Tencor Model AIT XP Darkfield Inspection System

    • Manufacturer: KLA-Tencor
    • Model: AIT XP

    The KLA-Tencor AIT XP+ Patterned Wafer Inspection system is designed to meet the needs of 0.13um and beyond design rule processes. Based on the highly popular AIT series, the AIT XP+ incorporates Mixed Mode Detec...

    San Jose, CA