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About the KLA-Tencor AIT
The KLA-Tencor AIT is an automated semiconductor inspection system designed to detect and classify wafer defects across front-end manufacturing. Built for production environments, the AIT streamlines inline inspection with fast throughput, repeatable results and integration capabilities for process control and yield improvement.
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KLA AIT II system
- Manufacturer: KLA-Tencor
- Model: AIT II
Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...
United States