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Jeol Scanning Electron Microscope (PC-SEM) JSM-6490 Bruker XFlash Detector
- Manufacturer: Jeol
Jeol Type: Jeol JSM-6490 Jeol scanning electron microscope Jeol JSM-6490 scanning electron microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope with newly developed electron optics an...