Building Filters
2002 Hitachi High-Tech Hitachi High-Tech S-3500N
- Model: S-3500N
emax failure Device name: Scanning electron microscope (SEM)
Tokyo, Japan
Tokyo, Japan
Hitachi High-Tech Hitachi High-Tech S-3700N
- Model: S-3700N
Device name: Scanning electron microscope (SEM)
Tokyo, Japan
Hitachi High-Technologies S-2600H
- Manufacturer: Hitachi
- Model: S-2600H
With EMAX Device name: Scanning electron microscope (SEM)
Tokyo, Japan
Hitachi S-2600H
- Manufacturer: Hitachi
- Model: S-2600H
Device name: Scanning electron microscope (SEM) | Remarks: PC startup not possible
Tokyo, Japan
Tokyo, Japan
Hitachi High-Tech Hitachi High-Tech S-3500N
- Model: S-3500N
Model year: February 2002 Specification: EMAX malfunction
Hitachi High-Technologies S-2600H
- Manufacturer: Hitachi
- Model: S-2600H
Year indicated: 2001 Spec: EMAX Failure
HITACHI S8000, S9000 series
- Manufacturer: Hitachi
Device modification Used equipment refurbishing sales Small-diameter and compound wafer compatible modification SMIF to Open Cassette modification Modification for multiple wafer types (using tray) Modification ...
Tokyo, Japan
Tokyo, Japan- Tokyo, Japan
- Tokyo, Japan
2005 HITACHI S-9380II
- Manufacturer: Hitachi
- Model: S-9380 II
Manufacturing process: examination | Inch: 12
Tokyo, Japan2008 HITACHI CG-4000
- Manufacturer: Hitachi
- Model: CG4000
Manufacturing process: examination | Inch: 12
Tokyo, Japan- Tokyo, Japan