- Trusted Seller
1998 Hitachi S 5000 Field Emission Scanning Electron Microscope
- Manufacturer: Hitachi
- Model: S-5000
- Ultra High Resolution - Accelerating Voltage: 30 kV - Magnification: 500,000x Performance - Image Resolution: 0.6 nm (at 30 kV),3.5 nm (at 1 kV) in secondary electron image Magnification - Low mag mode: x...
United States - Trusted Seller
1997 Hitachi S-4500 Type 11
- Manufacturer: Hitachi
- Model: S-4500
Scanning Electron Microscope (SEM) Wafer Size: Equipment Configuration: – Type II – EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guarant...
United States - Trusted Seller
1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)
- Manufacturer: Hitachi
- Model: S-4500
- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...
United States - Trusted Seller
1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)
- Manufacturer: Hitachi
- Model: S-4500
- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...
United States - Trusted Seller
Hitachi Hightech S-4500
- Manufacturer: Hitachi
- Model: S-4500
Metrology 8" Frame Scanning electron microscope Broken
Asia - Trusted Seller
Hitachi Hightech PD3000
- Manufacturer: Hitachi
- Model: PD3000
Metrology 8" Frame Mask visual inspection Offline
Asia 
1996 HITACHI S-5000
- Manufacturer: Hitachi
- Model: S-5000
*. Image Resolution: - 30KV 0.6nm - 1 KV 2.5nm with a test specimen *.Magnification 20X ~ 300,000X *. Stage Movement X ±3.5 mm,Y ±2 mm,Z ±0.3 mm,Tilt ±15 tilt *. Sample holder Column insert type *. Sample excha...
Cheonan-si, South Korea
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