Used transformator in Dublin, Ireland

Voltech PM100

• Manufacturer: Voltech

Details Using the proven technology of the world leading Voltech range, these analyzers allow precision bench-top measurements at the price of a portable meter. By connecting directly to the analyzer's 20A-rated ...

Chroma 19073

• Manufacturer: Chroma

Details Chroma 19073 AC/DC/IR Hipot Tester The Chroma 19073 combines both AC and DC Hipot with insulation resistance (IR) measurements into a single compact unit. The OSC function is used to check whether the con...

Yokogawa PZ4000

• Manufacturer: Yokogawa

Details YOKOGAWA PZ4000 - Available for The Yokogawa PZ4000 Power Analyser is a powerfull tool designed for R&D work relating to environmentally friendly energy-conserving products and technologies. The PZ4000 wa...

Yokogawa PZ4000

• Manufacturer: Yokogawa

Details YOKOGAWA PZ4000 - Available for The Yokogawa PZ4000 Power Analyser is a powerfull tool designed for R&D work relating to environmentally friendly energy-conserving products and technologies. The PZ4000 wa...

Yokogawa M1223RC A

• Manufacturer: Yokogawa

Details Yokogawa M1223RC-A / LEM MCTS400 with CM400 The Yokogawa M1223RC-A is a 400 Amp Peak Cur Transformer System consisting of a 19 Inch Rack Mount Power Supply/Signal Conditioning unit, from one to six CTs, a...

Yokogawa WT1800

• Manufacturer: Yokogawa

Details YOKOGAWA WT1800 Power Analyser ( call for availability ) The Yokogawa WT1800 Power Analyser is the ideal measurement solution for testing Product Efficiency, and the design of Inverters, Motor Drives, Lig...

BMI A116

Details The BMI A116 1–600 A Current Clamp delivers high-precision AC/DC measurements from 1 A to 600 A, seamlessly interfacing with BMI 4800 and 100G instruments. Its rugged 32 mm jaw opening, 100 kHz bandwidth,...

Chroma 19036

• Manufacturer: Chroma

Details Chroma 19036 Analyser The Chroma 19036 Wound Component Electrical Safety Test (EST) Analyser uniquely combines the functions of impulse test, hipot, insulation resistance and DC resistance measurements. I...