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Used FEI Metrology / Inspection (Semiconductors)

Trusted Seller
2016 FEI ExSolve CLM next Gen, 300mm
- used
- Manufacturer: FEI
FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2104
United States
Trusted Seller
2015 FEI ExSolve CLM next Gen, 300mm
- used
- Manufacturer: FEI
FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103
United States
Trusted Seller
FEI XL40 Cross-section SEM
- used
- Manufacturer: FEI
FEI XL40 CROSS SECTION SEM WORKING CONDITION refurbished AVAILABLE IN WAREHOUSE
Trim, Ireland
Trusted Seller
FEI TECNAIF30
- used
- Manufacturer: FEI
FEI TECNAI_F30 * ANALYSIS
Bree, Ireland
Trusted Seller
2007 FEI TECNAI G2
- used
- Manufacturer: FEI
- Model: TECNAI G2
De-installed, Warehoused, Can be inspected
Seoul, South Korea
Trusted Seller
2011 FEI Quanta 3D FEG
- used
- Manufacturer: FEI
- Model: QUANTA 3D FEG
De-installed, Warehoused, Can be inspected
Seoul, South Korea
FEI FEM2010F
- used
- Manufacturer: FEI
- Model: FEM2010F
Wafer size: N/A
Yongin-si, South Korea
FEI HELIOS-400S
- used
- Manufacturer: FEI
Wafer size: N/A
Yongin-si, South Korea
FEI FIB 820 (Mainbody only)
- used
- Manufacturer: FEI
Dual Beam
Yongin-si, South Korea
2005 FEI STARTA-400S
- used
- Manufacturer: FEI
Yongin-si, South Korea
FEI EXPIDA DB 1255
- used
- Manufacturer: FEI
Wafer size: N/A
Yongin-si, South Korea
Trusted Seller
FEI Helios Nanolab 600I
- used
- Manufacturer: FEI
- Wafer Size: 300 - Category: Semiconductor Fabrication - Family: Metrology Equipment - Type: Focused Ion Beam
Asia
FEI FEM2010F
- used
- Manufacturer: FEI
- Model: FEM2010F
FEI FEM2010F Dual beam S/N EM138717-32 Sales details
South Korea