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Used automation in Nagano, Japan

RESISTANCE METER RM3544
- new
RM3544-01 RM3544-01 Hioki DC resistance meters measure a broad range of resistance values at a high level of precision. The RM3544 is easy-to-use resistance testers suitable for use on either manual or automated ...
Nagano, Japan
IN-CIRCUIT TESTER FA1220-11
- new
- Manufacturer: HIOKI E.E
Slash preparation man-hours. Shorten takt times. Reduce waste. Detect and exclude defective boards. Expand your testing coverage. Maximize test functionality. Hioki provides robust support for populated circuit b...
Nagano, Japan
RESISTANCE HiTESTER RM3542
- new
RM3542-01 Hioki DC resistance meters measure a broad range of resistance values at a high level of precision. The RM3542 deliver high speed, high precision, and high reliability, indispensable for the shipping in...
Nagano, Japan
RESISTANCE HiTESTER RM3543
- new
RM3543-01 Hioki DC resistance meters measure a broad range of resistance values at a high level of precision. The RM3543 is designed to be integrated into current sensing resistor taping machines, deliver high-ac...
Nagano, Japan
BATTERY HiTESTER BT3561A
- new
Simultaneous measurement of internal resistance and open circuit voltage. Fully automated production line testing of small cells for power motors or small packs of up to 60 V. Measure from 0 Ω to 3.1 kΩ (minimum ...
Nagano, Japan
BATTERY HiTESTER 3561
- new
3561-01 Hioki benchtop battery testers support simultaneous high-speed measurement of internal resistance and battery voltage for the ever-expanding production lines of increasingly larger lithium-ion low resista...
Nagano, Japan
BATTERY HiTESTER BT3562A
- new
Simultaneous measurement of internal resistance and open circuit voltage. Fully automated production line testing of large cells for xEVs or mid-sized packs of up to 100 V. Measure from 0 Ω to 3.1 kΩ (minimum res...
Nagano, Japan
BATTERY HiTESTER BT3563A
- new
Simultaneous measurement of internal resistance and open circuit voltage. Fully automated production line testing of large packs for xEVs or large packs of up to 300 V. Measure from 0 Ω to 3.1 kΩ (minimum resolut...
Nagano, Japan