Used Test & Measurement (Semiconductors) in South Korea

ADVANTEST Advantest T5371

• Manufacturer: Advantest
• Model: T5371

Advantest T5371

LEICA INM300 Wafer Inspection

• Manufacturer: Leica

2002 NANOMETRICS Nanospec 9300

• Manufacturer: Nanometrics
• Model: Nanospec 9300

Currently 12" configured (It can be modified for 8" open cassette handling) Spectroscopic Reflectometer (SR) Two optical light sources Visable tungsten halogen lamp UV deuterium arc lamp Lens 4x,15x (Visible & UV...

BF-3DI

BF-3DI easily and accurately measures substrates in 3D With more than 7,000 AOI sales worldwide SAKI Corporation's know-how and image processing technology it's melted

BF-Comet10 / BF-Comet18

Maximum effect with minimum space Standard tabletop model Product / product / prize / tax / description / name

BF-Frontier II

Linesken high-speed appearance inspection machine Batch multiple images by linescan method Adopt SAKI's original scan system that can be acquired, Large size board (500mm*460mm) It scans in about 10 seconds and c...

BF-Planet XII

Through high-resolution 10um CCD line sensor camera 0402 chip and 0.4mm pitch lead, etc. inspection machine Scans M-size board (330mm*250mm) in about 9 seconds

AOI rental service

SAKI tester rental service

PA-500 Series Discontinued

Product Information Application of 5 Mega Pixel Camera (first in the world) 3D detection using 4 side-cameras Adoption of 4-division lighting system / 4 active lighting methods Minimize false defects by adopting ...

BF-Sirius

Optimal resolution for high-density mounting inspection L SIZE PCB (500mm*460mm) is scanned in about 10 seconds and within 18 seconds Inspection completed, simultaneous inspection of 2 or more M-size boards and m...

BF-10BT

Simultaneous inspection of both sides High resolution optimal for high-density mounting inspection Real-time defect management analysis Optimal for final process inspection As a double-sided simultaneous inspecti...

2011 KLA TENCOR Candela 8600

• Manufacturer: KLA-Tencor
• Model: Candela 8600

KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...

2011 KLA TENCOR Candela 8620

• Manufacturer: KLA-Tencor
• Model: Candela 8620

KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...

2011 KLA TENCOR Candela 8600

• Manufacturer: KLA-Tencor
• Model: Candela 8600

KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...

2012 KLA TENCOR Candeal 8620

• Manufacturer: KLA-Tencor
• Model: Candela 8620

KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...

Advantest B6700 Test & Measurement (semiconductors)

• Manufacturer: Advantest
• Model: B6700

Good condition Advantest B6700 Test & Measurement (semiconductors)s. Located in South Korea and other countries. Click request price for more information.