Thermal Microscopy
new
Thermal Microscopy Thermographic capturing system can pinpoint MWIR emissions within a semiconductor device. It can locates thermal hotspots arising from a variety of defects. It can be integrated into any of the...
SingaporeSEMICAPS 3000
new
SEMICAPS 3000 An inverted microscope system that is a tester dockable Features & Capabilities For backside analysis of wafers, wafer parts and packaged devices. Able to dock with ATE platforms Easily moved from T...
SingaporeSEMICAPS 4000
new
SEMICAPS 4000 An inverted system that is both analytical and tester dockable Features & Capabilities Analytical or ATE docked configuration 300 mm wafer stage including auto-lock compatible with Probe Cards and m...
Singapore