- Trusted Seller
UF3000 Wafer Prober bidding ends Tuesday Taiwan Local Time
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000
TSK UF3000 Wafer Prober 12″ Card Holder PH300 (382mm) Chuck type (Cool TEMP / Normal / Hot TEMP) Hot TEMP -40 ~ +150 Chuck Type (Gold / Nikel / Other ) Nikel Inking Function(Arm / Bridge) No SACC Yes (FLIP SACC) ...
Bree, Ireland 
Cascade Microtech S300 64518
- Manufacturer: Cascade Microtech
Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the ...
$55,000 USDFreehold Township, NJ- Trusted Seller
KLA AIT II system
- Manufacturer: KLA-Tencor
- Model: AIT II
Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...
United States 
KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...
$175,800 USDSan Jose, CA- Trusted Seller
Signatone S-M90
- Manufacturer: Signatone
- Model: S-M90
Process Type: Wafer Probes Status of Equipment: De-installed Includes Signatone WL170 RF Manual ProbeStation with SanjSCOPE™ EZ-THERM Lock-In Thermal Imaging System
United States 
COGNEX Wafer ID Reader
- Manufacturer: Cognex
Wafer ID Reader with Cognex Vision Confidence for the Entire Semiconductor Process Automatic Identification for Wafer Traceability For more than two decades, Cognex wafer ID systems have set the standard for high...
Sherwood, OR- Trusted Seller
Signatone CM-465-22
- Manufacturer: Signatone
- Model: CM-465-22
Status of Equipment: De-installed Process Type: Wafer Probes Signatone CM460-22 semiautomatic probe station which includes / SIGNATONE WL210 / Vibration Isolation Table /Monitor Mount, KEITHLEY 2636B SOURCE MET...
United States - Trusted Seller
2003 TEL P12XL
- Manufacturer: Tokyo Electron - TEL
- Model: P-12XL
TEL, P12XL, 300mm Tool Status Connected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober Software Version Standard CIM SECS GEM Process TEST Main System LA08 Prober 1 Factory Interfa...
United States - Trusted Seller
2004 TEL P12XL
- Manufacturer: Tokyo Electron - TEL
- Model: P-12XL
TEL, P12XL Prober, 300mm, TEL P12XL Prober single foup VIP3A Tool Status Disconnected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober single foup VIP3A Software Version Rby00-R016.02U1 ...
United States - Trusted Seller
Nikon 2B002-023 Arched Holder End Effector OPTISTATION 7 300mm Working Spare
- Manufacturer: Nikon
- Model: Optistation VII
“Removed from a Nikon OPTISTATION 7 300mm Automatic Wafer Inspection System” Nikon 2B002-023 Arched Holder End Effector OPTISTATION 7 300mm Working Spare Inventory # A-17931 Removed from a Nikon OPTISTATION 7 300...
$1,007 USDAlbuquerque, NM - Trusted Seller
KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States 
KLA-Tencor AIT I (8020)
- Manufacturer: KLA-Tencor
- Model: AIT I
A double darkfield patterned wafer inspection tool. Features: Automated wafer inspection system Double-dark field (DDF) laser scanning technology High detection sensitivity even for difficult after-etch, develop,...
San Jose, CA
KLA-Tencor AIT I In-Line Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT I
Automated full water inspection system for detecting particles as small as 0.10 micrometers on bare silicon and patterned process wafers Features: High detection sensitivity even for difficult after-etch, develop...
San Jose, CA
KLA-Tencor Model AIT XP Darkfield Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT XP
The KLA-Tencor AIT XP+ Patterned Wafer Inspection system is designed to meet the needs of 0.13um and beyond design rule processes. Based on the highly popular AIT series, the AIT XP+ incorporates Mixed Mode Detec...
San Jose, CA- Trusted Seller
HITACHI S-9220 CD-SEM available March 2025
- Manufacturer: Hitachi
- Model: S-9220
HITACHI S-9220 CD-SEM For Sale March 2025 - CSI Semi in Ireland, Europe Photos and Videos available - contact CSI Semi paul@csisemi.com 6" Wafer Set Up and 8" Chuck adapter. Serviced and Deinstalled by Hitach...
Bree, Ireland
Tip: Enter manufacturer, model or keyword
