- Trusted Seller
SHIBAURA H0811892 Operator Panel Display USED
- Manufacturer: Shibaura
0137A2 IROLPA FU2838 FPA134T-1 Expedited shipping services are available upon request. All taxes due are the responsibility of purchaser. Visitors are welcome to inspect equipment prior to purchase. This p...
$220 USDHolly, MI 
Agilent/Keysight 4155C Front Panel
- Manufacturer: Agilent - Keysight
- Model: 4155C
The Agilent 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory bench top solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V, and a...
Farmingdale, NJ
Tektronix 4200-PA
- Manufacturer: Tektronix
- Model: 4200-PA
The low current measurement capabilities of any SMU can be extended by adding an optional Remote PreAmp (Model 4200-PA). The 4200-PA provides 10aA resolution by effectively adding five current ranges to either SM...
$1,394 USDFarmingdale, NJ- Trusted Seller
KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA - Trusted Seller
KLA-Tencor AIT I Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA - Trusted Seller
Dage XD7500VR X-ray Inspection System
- Manufacturer: Nordson DAGE
- Model: XD7500VR
Dage XD7500VR X-ray Inspection System DOM: 2008 Standalone Open Tube 160kV 70 degree Oblique view 1,500 X Geometric Magnification (7,000 X system magnification) Easy Collision-Free, High Magnification Insp...
North Carolina, USA 
Tektronix 371B
- Manufacturer: Tektronix
- Model: 371B
The Industry Leader in High-Power Curve Tracers The 371B, the industry leader in high-power curve tracers, performs DC parametric characterization on a wide variety of power semiconductors including thyristors, S...
Agilent/Keysight 4155C
- Manufacturer: Agilent - Keysight
- Model: 4155C
The Agilent 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and add...
Agilent/Keysight 4156C
- Manufacturer: Agilent - Keysight
- Model: 4156C
The Agilent 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and ad...
Agilent/Keysight 04155-66545
- Manufacturer: Agilent - Keysight
The Agilent 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory bench top solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V, and ...
Farmingdale, NJ- Trusted Seller
1997 KLA AIT I Main System
- Manufacturer: KLA-Tencor
- Model: AIT I
Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...
United States - Trusted Seller
Agilent 4156C Semiconductor Parameter Analyzer
- Manufacturer: Agilent - Keysight
- Model: 4156C
General features Highly accurate laboratory bench top parameter analyzer for advanced device characterization 4x High-resolution SMU, 2xVSU and 2xVMU Fill-in-the blanks front panel operation Measurement capab...
United States 
KLA-Tencor SP1-TBI Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
KLA-Tencor's SP1 configured with KLA-Tencor's Trible-Beam Illumination (TBI). Specifications: Dual Dark Field Collection Channels. Sensitivity 60nm / 0.060µm. 0.001 ppm Haze Sensitivity. Argon Ion Laser (488nm. I...
San Jose, CA
KLA-Tencor SP1 Classic with single 200mm open cassette or single 300mm foup
- Manufacturer: KLA-Tencor
- Model: SP1
300/200mm wafers Dual Dark Field Collection Channels 0.079um Defect Sensitivity 0.001 ppm Haze Sensitivity Argon Ion Laser (488nm) Measurement Chamber with ULPA Filter and Blower Unit Operator Interface : MS Wind...
San Jose, CA
ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM
- Manufacturer: Orbotech
INFORMATION: ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM MODEL: FPI-7092 M SERIAL NO: SF 021005 DATE OF MFG: 06-2002 VOLTAGE: 120 VAC AMP: 32A FREQUENCY: 50/60 HZ The Orbotech FPI-7092 System is an AOI ...
Santa Barbara, CA
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