1997 Schmitt Measurement System TMS 2000
- Manufacturer: Schmitt Measurement System
AS-IS Wafer size: 6" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
1994 KLA TENCOR SFS 6200
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
*.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...
Cheonan-si, South Korea
NIKON Nikon Eclips L200 + NWL641
- Manufacturer: Nikon
- Model: NWL641
Nikon Eclips L200 - Motorize objectives Nikon NWL641 autoloader - Orientation flat/notch detection
Cheonan-si, South Korea
BIO-RAD QS-300
- Manufacturer: Bio-Rad
- Model: QS-300
BIO-RAD FT-IR QS-300 Spectrometer .FTS40 Spectrometer - He-Ne Laser - IR Source - DTGS Detector - KBr Beam Splitter .Up to 8 Inch, Wafer Tray/Nose Cone .FTS Power Supply .Windows XP PC & LCD Monitor .EPI,BPSG, C....
Cheonan-si, South Korea
2000 KLA TENCOR AIT AIT XP+(Fusion)
- Manufacturer: KLA-Tencor
- Model: AIT XP
[ System Configuration ] . CE marked . Single open cssette handler . Image Computer . (3) Collection Channels . Spot Size 7um, 5um, 3.5um . Internal Microscope Review - Microscope review Objectives 10x, 50x, 100x...
Cheonan-si, South Korea
1996 VEECO Dimension 7000
- Manufacturer: Veeco - Sloan
- Model: Dimension 7000
As-Is, 8" Automatic AFM tool Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2017 KLA TENCOR P-17
- Manufacturer: KLA-Tencor
[Features] - Microhead 5-xr (13, 131, 1048 um range) - Objective lens : 6.4x, Magnification range : 173x~750x - Scan full diameter of the sample without stitching for bow and film stress measurement - Fully motor...
Cheonan-si, South Korea
2010 SDI/SEMILAB MCV2500
- Manufacturer: Semilab
■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ CDA: 8...
Cheonan-si, South Korea
SDI/SEMILAB FAaST 200 SL
- Manufacturer: Semilab
- Model: FAAST 200 SL
non-contact electrical C-V & I-V measurement system capable of measuring on product wafers. Measurements can be made in scribe line test sites or in the active cell area. Cell measurements allow for the first ti...
Cheonan-si, South Korea
2006 N&K NK5300
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Cognex Pattern Recognition Software n&k's Thin Film Characterization S/W n&k's Standard Films Library Automated Wafer Loading/Unload...
Cheonan-si, South Korea
2007 N&K N&K Little foot 8000 CD
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Reflectance, Polarized Cognex Pattern Recognition Software Windows 7 Operating System n&k's Thin Film Characterization S/W n&k's Sta...
Cheonan-si, South Korea
2011 KLA TENCOR Candela 8600
- Manufacturer: KLA-Tencor
- Model: Candela 8600
KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...
Cheonan-si, South Korea
2011 KLA TENCOR Candela 8620
- Manufacturer: KLA-Tencor
- Model: Candela 8620
KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...
Cheonan-si, South Korea
Cheonan-si, South Korea
2006 KLA TENCOR CS20
- Manufacturer: KLA-Tencor
- Model: CS20
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
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