Used sem in osutoraria

2005 HITACHI S 3400 N Variable Pressure SEM

• Manufacturer: Hitachi
• Model: S-3400N

Still installed

FEI Nova NanoSEM 450 SEM

• Manufacturer: FEI

Type: SEM Wafer Size: Equipment Configuration: - 1-30 kV (500 volts possible); 50 volts possible using beam deceleration - Immersion lens - NavCam (navigation camera) and infrared CCD camera - Plasma cleaner...

Hitachi S 3000 N Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-3000N

- Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management - Ful...

FEI Company 4022.192.9204 Processor PCB Card UDTB/N XL 830 FIB-SEM Used Working

• Manufacturer: FEI

“FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System.” FEI Company 4022.192.9204 Processor PCB Card UDTB/N XL 830 FIB-SEM Used Working Inventory # A-13996 Model No: UDTB/N FEI...

FEI Company 4022.192.70094 Processor PCB Card HRDS 7009 XL 830 FIB-SEM Used

• Manufacturer: FEI

“Removed from a FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System.” FEI Company 4022.192.70094 Processor PCB Card HRDS 7009 XL 830 FIB-SEM Used Inventory # A-13999 Model No:...

Motorola 01W3394F10G SBC Single Board Computer PCB MVME 2401 JEOL JWS-2000 SEM

• Manufacturer: Motorola

“Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System” Motorola 01W3394F10G SBC Single Board Computer PCB MVME 2401 JEOL JWS-2000 SEM Inventory # CONF-1288 Model No: MVME 2401 ...

2013 FEI Quanta 450 SEM

• Manufacturer: FEI

- 50/60 Hz - 230V - Full load: 8A With: - Edwards RV 8 - Edwards PV 25 MK - FEI SE R 580 Detector Currently installed and in use every day, great condition.

1994 Hitachi S 4500 SEM

• Manufacturer: Hitachi
• Model: S-4500

1997 HITACHI S-8820 SEM

• Manufacturer: Hitachi
• Model: S-8820

They are offline in the clean storages. As Is Vintage : S-8820 – 1997 For S-8820 : Complete

1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

JEOL Jeol JSM-5910LV SEM Scanning Electron Microscope Lab

• Manufacturer: Jeol
• Model: JSM

This Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it was surplus to requirements. The system has not been tested. The Oxford dewar has come away from the unit and dent...