Used scanning electron microscope

HITACHI S-3400N Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-3400N

The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily and/or non-conductive ...

2002 Hitachi S 5200 Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-5200

SEM - Cold FE-Tip, Two SE Detectors - TMP Pumping System - Windows Control System - Oxford EDS System 2002 Vintage

Hitachi S 4500 Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

Hitachi S 3000 N Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-3000N

- Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management - Ful...

1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

1998 Hitachi S 5000 Field Emission Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-5000

- Ultra High Resolution - Accelerating Voltage: 30 kV - Magnification: 500,000x Performance - Image Resolution: 0.6 nm (at 30 kV),3.5 nm (at 1 kV) in secondary electron image Magnification - Low mag mode: x...

HITACHI S-4700 Type II Scanning Electron Microscope: Parts only

• Manufacturer: Hitachi
• Model: S-4700

Experience the precision and power of the Hitachi S-4700 Type II Scanning Electron Microscope, a versatile tool essential for detailed material analysis. The upright microscope structure allows for comfortable op...

1998 Hitachi S 5000 Field Emission Scanning Electron Microscope (FE-SEM)

• Manufacturer: Hitachi
• Model: S-5000

- Ultra high resolution

Anelva 912-7165 Ion Ultra High Vacuum Pump JEOL JSM-6300F SEM Working Surplus

• Manufacturer: Jeol
• Model: JSM

“Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System” Anelva 912-7165 Ion Ultra High Vacuum Pump JEOL JSM-6300F SEM Working Surplus Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope...

JEOL JSM-6300F Ion Vacuum Pump Magnet Assembly Wafer Defect Review SEM Working

• Manufacturer: Jeol
• Model: JSM

“Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System” JEOL JSM-6300F Ion Vacuum Pump Magnet Assembly Wafer Defect Review SEM Working Inventory # 21078 Removed from a JEOL JSM-6300F SEM Scanning ...

JEOL SM-40080 Unit Scan Rotation PCB Card SEM JSM-6300/6400F Working Surplus

• Manufacturer: Jeol
• Model: JSM-6400

JEOL SM-40080 Unit Scan Rotation PCB Card SEM JSM-6300/6400F Working Surplus Inventory # 17955 For use with the JEOL JSM-6300/6400F SEM Scanning Electron Microscope System This JEOL SM-40080 Unit Scan Rotation PC...

GW Electronics Type 43 Infrared Chamberscope JEOL JSM-6300/6400F Working Surplus

• Manufacturer: Jeol
• Model: JSM-6400

GW Electronics Type 43 Infrared Chamberscope JEOL JSM-6300/6400F Working Surplus Inventory # 21122 For use with the JEOL JSM-6300/6400F SEM Scanning Electron Microscope System This GW Electronics Type 43 Infrared...

JEOL AP002109-00 Processor PCB Card JSM-6300F SEM Working Surplus

• Manufacturer: Jeol
• Model: JSM

“Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System.” JEOL AP002109-00 Processor PCB Card JSM-6300F SEM Working Surplus Inventory # 21147 Removed from a JEOL JSM-6300F SEM Scanning Electron Mic...

JEOL EXT SCAN PB

• Manufacturer: Jeol

“Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System” JEOL BP102093-00 EXT SCAN PB PCB Card JWS-7555S Wafer Review SEM Working Spare Inventory # CONF-1220 Model No: EXT SCAN ...