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Lumentum - Surplus Semiconductor Fabrication Tools and Optical Communication Testers from Takao Japan Facility

by AllSurplus

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Used Test & Measurement (Semiconductors) in Chungcheongnam-do, South Korea

  • 2001 NIKON NWL641M

    2001 NIKON NWL641M

    • Manufacturer: Nikon
    • Model: NWL641

    IC Inspection Wafer Loader Orientation flat/notch detection

    Cheonan-si, South Korea
  • 2000 KLA TENCOR VIPER 2410

    2000 KLA TENCOR VIPER 2410

    • Manufacturer: KLA-Tencor
    • Model: Viper 2410

    KLA-Tencor's 2401 Automated Macro Defect Inspection System - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- cri...

    Cheonan-si, South Korea
12