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MEMORY HiLOGGER LR8450-01 (Wireless LAN model)
- Manufacturer: HIOKI E.E
Hioki Memory HiLoggers are high-speed data loggers for recording multiple channels of voltage, temperature, resistance or humidity signals, some models providing complete isolation between channels and strong noi...
Nagano, Japan
MEMORY HiLOGGER LR8450
- Manufacturer: HIOKI E.E
Hioki Memory HiLoggers are high-speed data loggers for recording multiple channels of voltage, temperature, resistance or humidity signals, some models providing complete isolation between channels and strong noi...
Nagano, Japan
HORIBA France SAS F-CLUE
- Manufacturer: Horiba
Compact Hyperspectral Cathodoluminescence The F-CLUE is the optical fiber coupled solution offering a flexible interface for Cathodoluminescence Imaging and Spectroscopy analysis. Thanks to its rugged ultra-compa...
Kyoto, Japan
HORIBA France SAS R-CLUE
- Manufacturer: Horiba
Raman Photoluminescence & Cathodoluminescence The R-CLUE all-in-one fiber coupled solution offers colocalized Raman, PhotoLuminescence and Cathodoluminescence Imaging and spectroscopy analysis. R-CLUE takes b...
Kyoto, Japan
HORIBA France SAS H-CLUE
- Manufacturer: Horiba
Versatile Hyperspectral Cathodoluminescence The H-CLUE direct coupled solution offers the ultimate performance for Cathodoluminescence Imaging and Spectroscopy analysis. Embedding field-proven optical components ...
Kyoto, Japan
BATTERY HiTESTER BT3561A
Simultaneous measurement of internal resistance and open circuit voltage. Fully automated production line testing of small cells for power motors or small packs of up to 60 V. Measure from 0 Ω to 3.1 kΩ (minimum ...
Nagano, Japan
BATTERY HiTESTER BT3562A
Simultaneous measurement of internal resistance and open circuit voltage. Fully automated production line testing of large cells for xEVs or mid-sized packs of up to 100 V. Measure from 0 Ω to 3.1 kΩ (minimum res...
Nagano, Japan
BATTERY HiTESTER BT3563A
Simultaneous measurement of internal resistance and open circuit voltage. Fully automated production line testing of large packs for xEVs or large packs of up to 300 V. Measure from 0 Ω to 3.1 kΩ (minimum resolut...
Nagano, Japan