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Used automated in Wexford, Ireland

  • Trusted Seller
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    Hao Mian Technology Automated Optical Inspection AOI Taping System SECS GEM

    • Manufacturer: Unknown

    Hao Mian Technology Automated Optical Inspection (AOI) + Taping System (SECS / GEM) Automated Optical Inspection (AOI) + Taping System (SECS / GEM)

    Bree, Ireland
  • Trusted Seller
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    Hao Mian Technology Automated Optical Inspection AOI Taping System SECS GEM

    • Manufacturer: Unknown

    Hao Mian Technology Automated Optical Inspection (AOI) + Taping System (SECS / GEM) Automated Optical Inspection (AOI) + Taping System (SECS / GEM)

    Bree, Ireland
  • Trusted Seller
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    KLA-Tencor VIPER KLA2410 200MM Automated Macro-Defect wafer inspection system

    • Manufacturer: KLA-Tencor
    • Model: Viper 2410

    KLA-Tencor VIPER KLA2410 200MM Automated Macro-Defect wafer inspection system

    Bree, Ireland
  • Trusted Seller
    NanoMetrics NanoSpec 8300

    NanoMetrics NanoSpec 8300

    • Manufacturer: Nanometrics
    • Model: Nanospec

    NanoMetrics NanoSpec 8300 Automated Film Thickness Measurement System – Automatic film thickness measurement system – Thin film analysis via Spectroscopic Ellipsometry, UV Reflectometry, and Visible Reflectometry...

    Bree, Ireland
  • Trusted Seller
    Reticle Inspection

    Reticle Inspection

    • Manufacturer: Unknown

    Tool Condition: tool is power off and installed in the cleanroom. STANDARD SPECIFICATIONS DESCRIPTION Main PC- Included x1 Keyboard & Mouse- Included x1 UPS- Included x1 Fully automated particle measurement modul...

    Bree, Ireland
  • Trusted Seller
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    Leica INM20

    • Manufacturer: Leica

    Leica INM20 LEICA AUTOMATED WAFER INSPECTION MICROSCOPE Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system

    Bree, Ireland
  • Trusted Seller
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    Leica POLYLITE 88

    • Manufacturer: Leica

    Leica POLYLITE 88 LEICA/REICHERT WAFER INSPECTION MICROSCOPE Automated Wafer Inspection Microscope Brightfield/Darkfield With LEP motorized wafer transport system

    Bree, Ireland
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    SELA EM2

    • Manufacturer: Unknown

    SELA EM2 Automated TEM and SEM sample preparation system – SELA EM2 A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cros...

    Bree, Ireland
  • Trusted Seller
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    Leica POLYLITE 88

    • Manufacturer: Leica

    Leica POLYLITE 88 LEICA/REICHERT WAFER INSPECTION MICROSCOPE Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system

    Bree, Ireland
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    Solder Paste Inspection

    • Manufacturer: Unknown

    Description: Symbion P36 In-line Automated Optical Inspection system for Post-paste inspection of printed circuit assemblies; includes: Offline Repair Station with FPD monitor for defect display and a programming...

    Bree, Ireland
  • Trusted Seller
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    Solder Paste Inspection

    • Manufacturer: Unknown

    Description: Symbion P36 In-line Automated Optical Inspection system for Post-paste inspection of printed circuit assemblies; includes: Offline Repair Station with FPD monitor for defect display and a programming...

    Bree, Ireland
  • Trusted Seller
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    Solder Paste Inspection

    • Manufacturer: Unknown

    Description: Symbion P36 In-line Automated Optical Inspection system for Post-paste inspection of printed circuit assemblies; includes: Offline Repair Station with FPD monitor for defect display and a programming...

    Bree, Ireland
  • Trusted Seller
    no-image_en.png

    Solder Paste Inspection

    • Manufacturer: Unknown

    Description: Symbion P36 In-line Automated Optical Inspection system for Post-paste inspection of printed circuit assemblies; includes: Offline Repair Station with FPD monitor for defect display and a programming...

    Bree, Ireland
  • Trusted Seller
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    KLA-Tencor Surfscan SP1 DLS

    • Manufacturer: KLA-Tencor
    • Model: Surfscan SP1

    KLA-Tencor Surfscan SP1 DLS The Surfscan SP1 DLS unpatterned wafer inspection system captures yield-limiting defects down to 50nm at high throughput, to accelerate yield learning rates across all process modules ...

    Bree, Ireland
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