VEECO D3100S-1
- Manufacturer: Veeco - Sloan
- Model: D3100S-1
Key Features : . Scans samples up to 8 inch . Little or no sample preparation for increased productivity . Rigid ,low vibration construction for superior image quality . Integrated top-view color video optics wit...
Cheonan-si, South Korea
SOLID STATE MEASRUEMENT INC. SSM2000
- Manufacturer: SOLID STATE MEASRUEMENT INC.
System Measurement Performance Computer Subsystem Automated Features •;; Probe conditioning /•;; Probe calibration /•;; Sample alignment /•;; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing S...
Cheonan-si, South Korea
2004 SOLID STATE MEASRUEMENT INC. SSM 2000 Nano SRP
- Manufacturer: SOLID STATE MEASRUEMENT INC.
System Measurement Performance Computer Subsystem Automated Features •; Probe conditioning /•; Probe calibration /•; Sample alignment /•; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing Subsy...
Cheonan-si, South Korea
2017 KLA TENCOR P-17
- Manufacturer: KLA-Tencor
[Features] - Microhead 5-xr (13, 131, 1048 um range) - Objective lens : 6.4x, Magnification range : 173x~750x - Scan full diameter of the sample without stitching for bow and film stress measurement - Fully motor...
Cheonan-si, South Korea
N&K OptiPrime - CD
- Manufacturer: N&K
Key Qualities of OptiPrime - CD ■ Optimized Polarized Reflectance (Rs and Rp) Data - Micro-Spot Technology ■ Can be Configured for 300 mm (12”), 200 mm (8”),and 150 mm (6”) Wafers ■ Fully Automated ■ Based on Pat...
Cheonan-si, South Korea
2006 N&K NK5300
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Cognex Pattern Recognition Software n&k's Thin Film Characterization S/W n&k's Standard Films Library Automated Wafer Loading/Unload...
Cheonan-si, South Korea
2007 N&K N&K Little foot 8000 CD
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Reflectance, Polarized Cognex Pattern Recognition Software Windows 7 Operating System n&k's Thin Film Characterization S/W n&k's Sta...
Cheonan-si, South Korea
1997 SOLID STATE MEASRUEMENT INC. SSM5200
- Manufacturer: SOLID STATE MEASRUEMENT INC.
Fully automated capacitance-voltage(CV),charge-voltage(QV), and current-voltage(IV) system [Direct Measurement] - Accurately measure CV, QV and IV characteristics of MOS test structures in scribe lines on product...
Cheonan-si, South Korea
2004 N&K N&K 3700 RT
- Manufacturer: N&K
Broadband spectrometry for film thickness on transparent substrates, including photomask reticles. The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These...
Cheonan-si, South Korea
2006 N&K N&K 5700 CDRT
- Manufacturer: N&K
Broadband spectrometry for film thickness and trench profile measurements on photomask reticles. The n&k 5700-CDRT automated system is designed for handling 5” or 6” square masks. The n&k 5700-CDRT simultaneously...
Cheonan-si, South Korea
Tip: Enter manufacturer, model or keyword