Used automated in California, USA

Kruss DSA100S automated contact angle and drop shape analysis system

sn 20067009 Upgraded video camera: USB 3.0 camera with the Sony IMX174 CMOS sensor delivers 164 frames per second at 2.3 MP resolution. Windows 10 PC with Kruss Advance software Manual drive XYZ sample stage

KLA-Tencor OmniMap RS100 Resistivity Mapping System

• Manufacturer: KLA-Tencor

With the ability to measure materials such as polysilicon, copper, and bulk silicon substrates. System capable of running 200mm and 300mm wafers. Specifications: System capable of running 200mm and 300mm wafers A...

Semilab CMS3 non contact sheet resistance measuring system

• Manufacturer: Semilab

CMS, CLS FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion. The CLS mo...

KLA-Tencor 2131 Defect Inspection System Upgraded to 2132

• Manufacturer: KLA-Tencor

The KLA-Tencor 2132 is a wafer defect inspection system. Features: Defect clustering and auto review Sampling blanket wafer inspection Automated inspection - automatic focusing SECS - GEM Fully automatic, non-con...

N&K 1512 Thin Film Measuring System

N&K 1512 Ultra-High Sensitivity Thin Film Measurement System Includes Calibration base wafer The n&k 1500 utilizes raw Reflectance (R) data to determine the optical properties (n and k) and thicknesses of thin...

KLA-Tencor HRP 320 High Resolution Profiler

• Manufacturer: KLA-Tencor

HRP (High Resolution Profiler) series from KLA-Tencor provides a comprehensive automated surface metrology solution for in-line process control of CMP and etch. Features: The HRP uses dual-stage, stylus-based sca...

KLA TENCOR P10

• Manufacturer: KLA-Tencor
• Model: P-10

Information:­­­­­­­ KLA TENCOR P10 KLA / TENCOR P10 Wafer Testing and Metrology Equipment is a user-friendly, automated, and flexible metrology system designed to meet the particular needs of semiconductor and ...

Frontier 4pp

• Manufacturer: Frontier Semiconductor

4-Point Probe Technique for measuring the sheet resistance of epi, metal films, substrates. Table top and fully automated cassette to cassette systems available.

Frontier 128G-450

• Manufacturer: Frontier Semiconductor

Film stress and wafer bow measurement for wafers up to 450mm diameter or flat panel displays. 2D/3D stress mapping standard. Semi-automated system with convenient wafer loading and retrieval.

Frontier 413 C2C

• Manufacturer: Frontier Semiconductor

Thickness and total thickness variation (TTV) mapping system. TTV and Thickness of wafer substrate, thick layers, wafers on tape, bonded wafers, etc. Fully automated cassette to cassette system, SECS/GEM complian...

Frontier 128 C2C

• Manufacturer: Frontier Semiconductor

Dedicated Film Stress mapping system with high resolution for high throughput process control for wafers up to 200mm diameter. Fully automated cassette to cassette, SECS/GEM Film Stress and Bow Measurement tool. ...