2005 NANOMETRICS Nanospec 6100
used
- Manufacturer: Nanometrics
- Model: Nanospec 6100
•; Linear array head •; Small spot size •; Fast focus •; Fast measurements •; Broad thickness ranges •; Multipurpose thin and thick film capability •; Continuous scanning from 210–;800 nanometers •; Optional UV c...
Cheonan-si, South Korea
1994 KLA TENCOR SFS 6200
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
*.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...
Cheonan-si, South Korea
NIKON Nikon Eclips L200 + NWL641
used
- Manufacturer: Nikon
- Model: NWL641
Nikon Eclips L200 - Motorize objectives Nikon NWL641 autoloader - Orientation flat/notch detection
Cheonan-si, South Korea
2000 KLA TENCOR AIT AIT XP+(Fusion)
used
- Manufacturer: KLA-Tencor
- Model: AIT XP
[ System Configuration ] . CE marked . Single open cssette handler . Image Computer . (3) Collection Channels . Spot Size 7um, 5um, 3.5um . Internal Microscope Review - Microscope review Objectives 10x, 50x, 100x...
Cheonan-si, South Korea
1996 VEECO Dimension 7000
used
- Manufacturer: Veeco - Sloan
- Model: Dimension 7000
As-Is, 8" Automatic AFM tool Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2002 NANOMETRICS Nanospec 9300
used
- Manufacturer: Nanometrics
- Model: Nanospec 9300
Currently 12" configured (It can be modified for 8" open cassette handling) Spectroscopic Reflectometer (SR) Two optical light sources Visable tungsten halogen lamp UV deuterium arc lamp Lens 4x,15x (Visible & UV...
Cheonan-si, South Korea
2011 KLA TENCOR Candela 8600
used
- Manufacturer: KLA-Tencor
- Model: Candela 8600
KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...
Cheonan-si, South Korea
2011 KLA TENCOR Candela 8620
used
- Manufacturer: KLA-Tencor
- Model: Candela 8620
KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...
Cheonan-si, South Korea
RUDOLPH AXI-S
used
- Manufacturer: Rudolph
- Model: AXI
Macro Inspection System to detect wafer level and die level defects. Up to 8" 2 Load Port
Cheonan-si, South Korea
RUDOLPH AXI-930
used
- Manufacturer: Rudolph
- Model: AXI 930
Macro Inspection System to detect wafer level and die level defects. Up to 8" 2 Load Port Parts machine
Cheonan-si, South Korea
1996 KLA TENCOR FLX2908
used
- Manufacturer: KLA-Tencor
- Model: FLX2908
*. Installed in Clean-room. Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2011 KLA TENCOR Candela 8600
used
- Manufacturer: KLA-Tencor
- Model: Candela 8600
KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...
Cheonan-si, South Korea
2012 KLA TENCOR Candeal 8620
used
- Manufacturer: KLA-Tencor
- Model: Candela 8620
KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...
Cheonan-si, South Korea
2001 NIKON NWL641M
used
- Manufacturer: Nikon
- Model: NWL641
IC Inspection Wafer Loader Orientation flat/notch detection
Cheonan-si, South Korea
2000 KLA TENCOR VIPER 2410
used
- Manufacturer: KLA-Tencor
- Model: Viper 2410
KLA-Tencor's 2401 Automated Macro Defect Inspection System - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- cri...
Cheonan-si, South Korea
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