TA Instruments ElectroForce 328122
- Manufacturer: TA Instruments
Used Bose ElectroForce Test Bench System for sale. SSLLC offers a wide selection of used Metrology for your Used Lab Equipment needs. TA Instruments Bose ElectroForce TestBench configurations were designed with c...
Woonsocket, RI
KLA-Tencor 5200 Overlay Inspection System
- Manufacturer: KLA-Tencor
- Model: 5200
Features: Automatic arrayed target measurement; CPM advanced overlay Bi-directional SECS/GEM communication Unlimited sites Low backside contamination including coating Specifications: 0.02 particles cm 2 per pass...
San Jose, CA- Trusted Seller
Overlay Measurement System
- Manufacturer: Unknown
System to include the following: Archer AIM-03 Dual Fims Fully automated overlay measurement module including coherence probe interference microscope and automated wafer handling – measures BiB and AIM Grating ta...
Bree, Ireland - Trusted Seller
Darkfield Inspection
- Manufacturer: Unknown
Currently configured for 300mm wafer sizes Idle Date: 2/23/2013 Tool status: de installed & store in the clean room Cassette Interface: o Dual FIMS (300mm), Phoenix v1.3 o PHX Ship Kit included o Pre-Alig...
Bree, Ireland 
NCS NCS-PAUT automatic ultrasonic phased array flaw detection equipment for bars
- Manufacturer: Steel Nano
Instrument description suitable for metallurgy and steel, machinery, electric power, aerospace, oil and gas, boilers and other industries bar surface and internal defects detection. Instrument features 1. phased ...
Beijing, China
NCS OPA-1000L Dual Light Source Fully Automatic Oversized Metal Component In-Situ Analyzer
- Manufacturer: Steel Nano
Instrument name: OPA -1000L Dual Light Source Fully Automatic Oversized Metal Component In-Situ Analyzer | Instrument model: OPA-1000L | Spectral range: 160 nm ~ 650 nm | Primary dispersion ratio: 0.74 nm/mm | S...
Beijing, China
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