- Trusted Seller
Rudolph Research Analytical AutoEL II Automatic Ellipsometer TY-72423
used
- Manufacturer: Rudolph Research Analytical
Elkin, NC TRIO-TECH G-233F Leak Detector Filtration System 110V
used
- Manufacturer: Trio-Tech
- Model: G233F
“Used item as seen in the images.” TRIO-TECH G-233F Leak Detector Filtration System 110V 0-B752B-73255-CH This item is listed for free local pickup. We will ship freight at the expense of the purchaser. Please ...
$1,557 USDBaroda, MI- Trusted Seller
2008 Mirtec MV-3U AOI Machine
used
- Manufacturer: Mirtec
100V – 240V 4.4 Amps 50-60 Hz The system uses Microsoft XP
Koh young 3D solder Paste Inspection Machine KY8030 3
used
- Manufacturer: Koh Young
- Model: KY8030-3
Koh Young KY8030 3D SPI Automated Solder Paste Inspection Machine 4Tech Electronics Contact Info To find out about current specials or package deals please send us a email or give us a call. Payment Policy Paymen...
2018 TEL Precio
used
- Manufacturer: Tokyo Electron - TEL
- Model: Precio
Like New Tri Temp Precio Probers, never used in production. Temp Range -°25 Good Working Condition/Off-Line TEL Precio (vintage 2018) Dual FOUP Interface Wafer size (mm) 200,300 Stage technology Linear motor No h...
Grayslake, IL- Trusted Seller
NEW Takano WM-7SR Surface Particle Inspection System
used
- Manufacturer: Takano
- Model: WM-7
TAKANO WM-7SR SURFACE PARTICLE INSPECTION SYSTEM consisting of:- Model: WM-7SR- Bare wafer surface defect inspection system- Substrate/Sizes: 2" - 8" Wafer Capable (Chuck and Carrier type dependent)- Substrate Th...
Decatur, GA 2013 Advantest T2000LS
used
- Manufacturer: Advantest
- Model: T2000LS
T2000 LS with RF Option T2000LS with RF Option - Please see PDF for configuration.
Grayslake, IL2012 Teradyne J750
used
- Manufacturer: Teradyne
- Model: J750
(4) 512 TH J750 Testers/ (1) 1024 TH Working Condition with Manipulator and Power Transformer. Configurable depending on availability. (8) HSD100 | (4) MTO | (4) DPS | (1) CTO | (1) CUB (8) HSD100 | (4) MTO | (...
Grayslake, IL2019 TSK UF3000LX
used
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000
Working Condition UF3000LX. Power On Demo available. Comes with ND4 Docking Kit. Configured to dock with ND4. Please see PDF for full configuration.
Grayslake, IL2005 Advantest T5593
used
- Manufacturer: Advantest
- Model: T5593
Fully Operational Working Condition T5593 Memory Tester. Please see the detailed configuration in PDF. Good Working Condition/On-Line Diagnostic Board included.
Grayslake, IL- Trusted Seller
Takano Altax 300ex Micro Bump Whole Surface Inspection System
used
- Manufacturer: Takano
Takano Altax 300ex Micro Bump Whole Surface Inspection System consisting of:- Model: Altax 300ex- Micro Bump Whole Surface Inspection System- Substrate/Sizes: 12" Wafer Capable - 40WPH/12 inch high-speed full lot...
Decatur, GA - Trusted Seller
KLA-Tencor SP1 TBI Unpatterned Surface Inspection System
used
- Manufacturer: KLA-Tencor
- Model: SP1
KLA-TENCOR SP1 TBI UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 TBI- Up to 300mm Wafers- Inquire about Handler Options for Various Size Wafers- Unpatterned Surface Inspection System - Wafer M...
Decatur, GA - Trusted Seller
Dage XD7500VR X-ray Inspection System
used
- Manufacturer: Nordson DAGE
- Model: XD7500VR
Dage XD7500VR X-ray Inspection System DOM: 2008 Standalone Open Tube 160kV 70 degree Oblique view 1,500 X Geometric Magnification (7,000 X system magnification) Easy Collision-Free, High Magnification Insp...
North Carolina, USA - Trusted Seller
Nordson 205453 Pressure Transducer
new
- Manufacturer: Nordson
Nordson 205453 Pressure Transducer Nordson 205453 Pressure Transducer The Nordson 205453 Pressure Transducer is a high-performance device used to measure and convert pressure into an electrical signal for monitor...
$560 USDFleetwood, PA - Trusted Seller
KLA-Tencor Surfscan 6220 Particle Inspection System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-TENCOR SURFSCAN 6220 PARTICLE INSPECTION SYSTEM consisting of: - Model: Surfscan 6220- Particle Inspection System- Bare Wafer Surface Defect Inspection System- Substrate/Sizes: 2", 3", 4", 6" and 8" Wafer Cap...
Decatur, GA CDE Resmap Test & Measurement (semiconductors)
used
- Manufacturer: CDE
- Model: Resmap
Good condition CDE Resmap Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA