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Lumentum - Surplus Semiconductor Fabrication Tools and Optical Communication Testers from Takao Japan Facility

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Used Semiconductors in Chungcheongnam-do, South Korea

  • VEECO D3100S-1

    VEECO D3100S-1

    • used

    • Manufacturer: Veeco - Sloan
    • Model: D3100S-1

    Key Features : . Scans samples up to 8 inch . Little or no sample preparation for increased productivity . Rigid ,low vibration construction for superior image quality . Integrated top-view color video optics wit...

    Cheonan-si, South Korea
  • N&K OptiPrime - CD

    N&K OptiPrime - CD

    • used

    • Manufacturer: N&K

    Key Qualities of OptiPrime - CD ■ Optimized Polarized Reflectance (Rs and Rp) Data - Micro-Spot Technology ■ Can be Configured for 300 mm (12”), 200 mm (8”),and 150 mm (6”) Wafers ■ Fully Automated ■ Based on Pat...

    Cheonan-si, South Korea
  • Microsense Microsense 6033T

    Microsense Microsense 6033T

    • used

    • Manufacturer: Microsense

    Wafer Thickness gauge for up to 150mm wafers Wafer size: 6" | Sell status: SELL | Tool's condition: AS-IS

    Cheonan-si, South Korea
  • SOLID STATE MEASRUEMENT INC. SSM2000

    SOLID STATE MEASRUEMENT INC. SSM2000

    • used

    • Manufacturer: SOLID STATE MEASRUEMENT INC.

    System Measurement Performance Computer Subsystem Automated Features •;; Probe conditioning /•;; Probe calibration /•;; Sample alignment /•;; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing S...

    Cheonan-si, South Korea
  • 2006 N&K N&K 5000-CD

    2006 N&K N&K 5000-CD

    • used

    • Manufacturer: N&K

    To be fully refurbished. Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS

    Cheonan-si, South Korea
  • 2012 KLA TENCOR P16+

    2012 KLA TENCOR P16+

    • used

    • Manufacturer: KLA-Tencor
    • Model: P16

    The KLA-Tencor P-16+ Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces. •; Up to 8" wafer size •; Microhead 5 - sr •; Dual view optic (Top & sid...

    Cheonan-si, South Korea
  • 2004 SOLID STATE MEASRUEMENT INC.

    2004 SOLID STATE MEASRUEMENT INC. SSM 2000 Nano SRP

    • used

    • Manufacturer: SOLID STATE MEASRUEMENT INC.

    System Measurement Performance Computer Subsystem Automated Features •; Probe conditioning /•; Probe calibration /•; Sample alignment /•; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing Subsy...

    Cheonan-si, South Korea
  • 2010 SDI/SEMILAB MCV2500

    2010 SDI/SEMILAB MCV2500

    • used

    • Manufacturer: Semilab

    ■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ CDA: 8...

    Cheonan-si, South Korea
  • SDI/SEMILAB FAaST 200 SL

    SDI/SEMILAB FAaST 200 SL

    • used

    • Manufacturer: Semilab
    • Model: FAAST 200 SL

    non-contact electrical C-V & I-V measurement system capable of measuring on product wafers. Measurements can be made in scribe line test sites or in the active cell area. Cell measurements allow for the first ti...

    Cheonan-si, South Korea
  • 2011 KLA TENCOR Candela 8600

    2011 KLA TENCOR Candela 8600

    • used

    • Manufacturer: KLA-Tencor
    • Model: Candela 8600

    KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...

    Cheonan-si, South Korea
  • 2012 KLA TENCOR Candeal 8620

    2012 KLA TENCOR Candeal 8620

    • used

    • Manufacturer: KLA-Tencor
    • Model: Candela 8620

    KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...

    Cheonan-si, South Korea
  • 2006 N&K NK5300

    2006 N&K NK5300

    • used

    • Manufacturer: N&K

    Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Cognex Pattern Recognition Software n&k's Thin Film Characterization S/W n&k's Standard Films Library Automated Wafer Loading/Unload...

    Cheonan-si, South Korea
  • 2007 N&K N&K Little foot

    2007 N&K N&K Little foot 8000 CD

    • used

    • Manufacturer: N&K

    Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Reflectance, Polarized Cognex Pattern Recognition Software Windows 7 Operating System n&k's Thin Film Characterization S/W n&k's Sta...

    Cheonan-si, South Korea
  • 1993 KLA TENCOR FLX2320

    1993 KLA TENCOR FLX2320

    • used

    • Manufacturer: KLA-Tencor
    • Model: FLX-2320

    *.Measurement *.Utility *.Intalled in a clean room and can demonstrate any time.

    Cheonan-si, South Korea
  • 2009 KLA TENCOR CS10V

    2009 KLA TENCOR CS10V

    • used

    • Manufacturer: KLA-Tencor
    • Model: CS10V

    [ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...

    Cheonan-si, South Korea
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